On iOS 9 and up (full control mode), at some scenarios, SeeTest may fail to perform actions( i.e open object-spy ) on a page that contains a very large number of elements,
In order to resolve this issue you can use one of the following methods:
Node-based dump (recommend).
Set Dump parameters.
- Dump by grid sampling.
This ability should be configured per application using its bundle identifier.
In order to configure that ability:
- Open the "ios_dump.properties" found here.
Add the line:
For example, application with bundle identifier 'com.experitest.eribank' will add the line:
Deleting the line from the "ios_dump.properties" file will use the default dump on the application.
By default, Safari application bundle identifier is found at the "ios_dump.properties" file.
Set Dump Parameters
If the Node-based dump method did not work you can use this method to define specific dump parameters to limit the element's numbers.
there are 3 dump parameters:
Depth - Define the depth of the element hierarchy tree.
Total - Define the total amount of elements in the dump.
Children - For each element (node) what are the max node's successors (children).
Improvements in the non-instrumented dump
From STA 10.3 the 'Class' property has changed and now is more informative.
To go back to the older dump - add to the app.property file the property: 'xcelement.type.include=false'
Dump by grid sampling :
Create dump by sampling grid of points, SamplesX refers to how many samples on X-Axis when a device is in portrait orientation when in Landscape the samples on each axis will switch.
We recommend try first default value which is 5,12,5,true,false and if it does not create the expected dump only then try other values.
to use this method add to app.properties the following property: